Enhancement of the Semiconductor Test Process
High frequency/speed test is required for semiconductors due to rapid spread of various huge information in our living field.
In addition, semiconductors are also required fine pin-pitch and multiple-pins due to smaller semiconductor package.
Now semiconductor tester is required to test more than 10,000 pins with high frequency range and speeds at once and it makes >10,000 Kg force to contact pins. This is impacted to the lifecycle to the tester and tester components such as sockets.
UPT offers the U-Rubber solution for semiconductor tester which are less low force, small footprint, long lifetime/lifecycle, and support high current and high frequency range test.
The U-Rubber is designed and used by UPT original material “Union-Alloy” which is high conductivity and used UPT original silicon rubber, and the force at 1-contact pin is around 0.098N – 0.240N.
The U-Rubber is best solution for Semiconductor tester.
- Contact Height: 0.45mm～
- High speed : 60GHz@-1dB
- Low Force : 0.1N／Pin
- Support 60GHz@-1dB
- Current :１A／Contact (with 0.45mm contact length)
We offer the customize solution (Sheet-size/Contact stroke length/and more)
Flexible arrangement/ allocation of the contact pins, and alignment is ±2.5μm.
Assemble the 0.45mm~ contact height on the silicon rubber sheet which existing technology could not be supported.
We also offer the customize sheet size and pin pitch width.
Pin pitch is 0.15mm for high speeds signal, which allow customers to use their space effectively.
Support the Lifetime/Lifecycle/Repeatability 50,000 times.
＊Depend on the contact pin size/design/material.
Support high frequency range for 5G world. Support up to 1A current to use original low resistance material with 0.45mm contact pin height
Support ～0.1N／Pin force and allow customers to implements thousands contact pins.
Pin pitch is 0.15mm, this allow to implement >10,000 contact pins in quoter-coin.