Custom Solutions for Semiconductor Testing Issues
What is Semiconductor Final Test?
Final test is to check if the semiconductor performs as designed, and can be broken down into three types of tests.
- “Functional Test” checks the basic logic circuits of the IC to ensure they work correctly, and confirm if the IC performs its intended tasks.
- “AC Test” performs timing tests that evaluate propagation delays for clock and data signals, and key logic circuits at their operating frequency.
- “DC Test” checks if the device meets operational standards by assessing input / output voltage ranges and buffer characteristics. Measurement methods include open / short tests on data signal and power terminals.
Additionally, test houses conduct environmental tests to verify performance under various conditions, parametric tests to measure electrical characteristics, stress tests to ensure durability against overvoltage and overcurrent conditions, and temp cycle test. Semiconductor device manufacturers finally guarantee product reliability and quality with these tests.
UPT’s Semiconductor Test Solutions
UPT offers test socket solution that are integrated into automatic test equipment (ATE) for semiconductor final test. Our final test sockets play a vital role in conducting precise and efficient functional and AC / DC tests. We offer solutions that can address difficult challenges such as miniturization, narrow-pitch, high frequencies, high currents, multi-pin, and low contact resistance.
Our Portfolio
Final Test Socket: MMS（Micro Metal Socket®）
MMS is a new concept socket UPT developed. MMS supports complex requirements such as high-current and high frequency, and supports for next generation semiconductors.
Anisotropic Conductive Sheet: UHSS®（Union High Speed Sheet）
UHSS® is an anisotropic conductive sheet made from woven fibers plated through both sides. It features flexibility that maintains conductivity even when bent, high customization potential, and high-speed signal compatibility up to 100GHz or 200Gbps. With a required contact pressure of only 1N/mm² and durability for 50,000 cycles (according to our data), UHSS® delivers both reliability and performance.
Semiconductor Test Probe Pin: Union Contact™
Union Contact™ is a uniquely structured, one-piece probe pin designed for semiconductor testing. Compared with conventional probe pins, it offers higher conductivity, lower resistance, and reduced contact pressure. Its longevity also helps reduce costs, providing efficient and reliable testing for semiconductors.
