Enhancement of the Semiconductor Test Process
The importance for semiconductors to support the high frequency/speed is required due to rapid spread of various huge information in our living field.
In addition, semiconductors are also required smaller pin-pitch and multiple-pins due to smaller semiconductor package.
Now semiconductor tester is required to test more than 10,000 pins with high frequency range and speeds at once
and it makes >10,000 Kg force to contact pins. This is impacted to the lifecycle to the tester and tester components such as sockets.
UPT offers the micro-metal-socket solution for semiconductor tester which are less low force, small footprint, long lifetime/lifecycle, and support
high current and high frequency range test.
The micro-metal-socket is designed and used by UPT original material “Union-Alloy” which is high conductivity and used UPT original silicon rubber,
and the force at 1-contact pin is around 0.098N – 0.240N.
The micro-metal-socket is best solution for Semiconductor tester.