One-Piece Contact Pins : Superior Conductivity, Low Force, and Long Life
Test probe pins are essential components in semiconductor testing that enable precise electrical measurement and signal transmission between devices and test systems.
UPT’s Union Contact™ introduces a breakthrough one-piece design that offers superior conductivity, low contact force, and exceptional durability—reducing maintenance needs and overall test costs.
With extensive experience in semiconductor testing solutions, UPT provides custom designs tailored to your specifications. For reliable, high-performance probe pins, consult UPT for the optimal Union Contact™ solution.
What are Test Probe Pins?
Test probe pins are high-precision contact components used in semiconductor testing equipment to measure electrical characteristics and transmit signals accurately.
They serve as temporary electrical connections between the test system and semiconductor devices, ensuring reliable signal transfer and stable measurement during inspection processes.
About Union Contact™ – Comparison with Conventional Probe Pins
UPT’s Union Contact™ probe pins feature a unique one-piece structure that delivers enhanced conductivity and low contact force. In addition, Union Contact™’s long lifetime contributes significantly to cost savings, enabling efficient and highly reliable semiconductor testing. UPT offers the custom Union Contact™ design to meet your specific requirements.
How Union Contact™ Differs from Conventional Probe Pins
Traditional probe pins consist of multiple parts—barrel, spring, and plunger—resulting in increased contact resistance between components, which often reduces conductivity. Additionally, the friction and spring force create higher loads, leading to faster wear and shorter lifetime.
On the other hand, Union Contact™ adopts a proprietary one-piece structure that integrates all components. This eliminates contact resistance between parts, ensuring high conductivity, low resistance, low force, and long lifetime.
Examples of Union Contact™ Applications
Semiconductor Reliability Test
Union Contact™ is the ideal solution for testing semiconductor performance and durability. Its high conductivity and low force ensure accurate and reliable data acquisition, enhancing the efficiency of your tests.
Interposer
Interposers are intermediate boards that facilitate signal transmission between different circuits and components. Union Contact™ can be used as an interposer by improving signal transmission efficiency through high conductivity, low force, and long lifetime. Its durable design also helps reduce maintenance costs.
Use-Case of Union Contact™
Customer’s Challenge
It is difficult to stably measure the high-frequency signal from memory and logic ICs using traditional probe pins.
UPT’s Solution
UPT proposed Union Contact™, a simple one-piece design offering superior high-frequency performance compared to traditional pins without compromising durability.
Introducing MMS Test Socket
UPT also offers Micro Metal Socket® (MMS), a test socket incorporating Union Contact™. MMS supports the miniaturization and narrow-pitch designs of semiconductor ICs, and its simple one-piece design provides excellent high-frequency characteristics. We are continually developing products with higher current capacity, lower contact resistance, reduced force, and enhanced durability to meet the demands of high-frequency and AI-driven semiconductor final testing.
FAQ
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What range of pitch, shape, and length does Union Contact™ support?
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Union Contact™ can be customized to accommodate various pin pitches, shapes, and lengths according to your test requirements. It is suitable for fine-pitch ICs and high-density packages, ensuring stable and accurate contact even in compact layouts.
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What is the typical durability or life cycle of Union Contact™?
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Union Contact™ is designed for long-term use.
While actual service life may vary depending on test conditions, it can withstand and remain usable for several hundred thousand contact cycles or more.
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How does Union Contact™ perform in high-frequency or high-speed signal testing?
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Thanks to its one-piece structure with minimal contact resistance, Union Contact™ provides excellent signal integrity for high-frequency applications. It offers low reflection and low-loss characteristics, making it ideal for GHz-band and high-speed IC testing.
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What are the lead time and minimum order quantity for custom designs?
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Lead time and minimum order quantity depend on the level of customization required. Standard modifications can often be delivered within a few weeks, while fully custom designs may require additional engineering time. UPT will provide a detailed schedule and quotation upon reviewing your specifications.
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Is Union Contact™ compatible with existing test sockets or probe card designs?
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In many cases, Union Contact™ can be adapted to fit existing test environments with minimal modification. Our engineering team can evaluate your current setup and propose the best integration method to ensure smooth replacement and optimal performance.