Innovative One-piece Contact Pins, Superior Conductivity, Low Force and Long Life
What is Union Contact™ Semiconductor Test Probe Pin?
Probe pins are high-precision contact components used in semiconductor testing equipment for measuring electrical properties and transmitting signals. UPT’s “Union Contact™” probe pins feature a unique one-piece structure that delivers enhanced conductivity and low contact force. Also, Union Contact™’s long life-time contributes significantly to cost savings, enabling efficient and highly reliable semiconductor testing. UPT offers the custom design of Union Contact™ to meet your specific requirements.
How Union Contact™ Differs from Conventional Probe Pins
Traditional probe pins consist of multiple parts—barrel, spring and plunger—resulting in increased contact resistance between components, which often reduces conductivity. Additionally, the friction and spring force create higher loads, leading to faster wear and shorter life-time.
On the other hand, Union Contact™ adopts a proprietary one-piece structure that integrates all components. This eliminates contact resistance between parts, ensuring high conductivity, low resistance, low force and long life time.
Examples of Union Contact™ Applications
Semiconductor Reliability Test
Union Contact™ is ideal solution for testing semiconductor performance and durability. Its high conductivity and low force ensure accurate and reliable data acquisition, enhancing the efficiency of your tests.
Interposer
Interposers are intermediate boards that facilitate signal transmission between different circuits and components. Union Contact™ can be used as an interposer by improving signal transmission efficiency with high conductivity, low force, and long life time. Its durable design also helps reduce maintenance costs.
Use-Case of Union Contact™
Customer’s Challenge
There is difficulty to measure stably the high-frequency signal from memory and logic ICs by using traditional probe pins.
UPT’s Solution
UPT proposed the Union Contact™, a simple one-piece design offering superior high-frequency performance without compromising on durability, compared with traditional pins.
Introducing MMS Test Socket
UPT also offers MMS (Micro Metal Socket®), a test socket incorporating Union Contact™. MMS supports the miniaturization and narrow-pitch designs of semiconductor ICs, and its simple one-piece contact design provides excellent high-frequency characteristics. We are continually developing products with higher current capacity, lower contact resistance, reduced force, and enhanced durability to meet the demands of high-frequency and AI-driven semiconductor final testing.
